Haendler, B. : rechercher sur Z-Library

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1

Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors

S Haendler, J Jomaah, G Ghibaudo, F Balestra

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 560 KB

english, 2001

2

Sub-threshold 10T SRAM bit cell with read/write XY selection

Feki, Anis, Allard, Bruno, Turgis, David, Lafont, Jean-Christophe, Drissi, Faress Tissafi, Abouzeid, Fady, Haendler, Sebastien

Journal:

Solid-State Electronics

Année:

2015

Langue:

english

Fichier:

PDF, 3.61 MB

english, 2015

3

Characterization and modeling of drain current local variability in 28 and 14nm FDSOI nMOSFETs

Ioannidis, E.G., Haendler, S., Josse, E., Planes, N., Ghibaudo, G.

Journal:

Solid-State Electronics

Année:

2016

Langue:

english

Fichier:

PDF, 10.52 MB

english, 2016

4

[IEEE 2017 International Conference on Noise and Fluctuations (ICNF) - Vilnius, Lithuania (2017.6.20-2017.6.23)] 2017 International Conference on Noise and Fluctuations (ICNF) - Low Frequency Noise in advanced 55nm BiCMOS SiGeC Heterojunction Bipolar Transistors: Impact of collector doping

Sagnes, B., Pascal, F., Seif, M., Hoffmann, A., Haendler, S., Chevalier, P., Gloria, D.

Année:

2017

Langue:

english

Fichier:

PDF, 4.50 MB

english, 2017

5

Western Diet Triggers NLRP3-Dependent Innate Immune Reprogramming

Christ, Anette, Günther, Patrick, Lauterbach, Mario A.R., Duewell, Peter, Biswas, Debjani, Pelka, Karin, Scholz, Claus J., Oosting, Marije, Haendler, Kristian, Baßler, Kevin, Klee, Kathrin, Schulte-Sc

Journal:

Année:

2018

Langue:

english

Fichier:

PDF, 12.35 MB

english, 2018

6

[IEEE ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) - Cracow, Poland (2019.9.23-2019.9.26)] ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) - 28nm FDSOI Platform with Embedded PCM for IoT, ULP, Digital, Analog, Automotive and others Applications

ARNAUD, F., HAENDLER, S., CLERC, S., RANICA, R., GANDOLFO, A., WEBER, O.

Année:

2019

Langue:

english

Fichier:

PDF, 2.30 MB

english, 2019

7

Low frequency noise in 0.12 μm partially and fully depleted SOI technology

François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra

Journal:

Microelectronics Reliability

Année:

2003

Langue:

english

Fichier:

PDF, 269 KB

english, 2003

8

Ordinary least squares as a method of measurement

W. Balzer, E.-W. Haendler

Journal:

Année:

1989

Langue:

english

Fichier:

PDF, 734 KB

english, 1989

9

Impact of a 10 nm ultra-thin BOX (UTBOX) and ground plane on FDSOI devices for 32 nm node and below

C. Fenouillet-Beranger, P. Perreau, S. Denorme, L. Tosti, F. Andrieu, O. Weber, S. Monfray, S. Barnola, C. Arvet, Y. Campidelli, S. Haendler, R. Beneyton, C. Perrot, C. de Buttet, P. Gros, L. Pham-Ngu

Journal:

Solid-State Electronics

Année:

2010

Langue:

english

Fichier:

PDF, 1.16 MB

english, 2010

10

Presenting the Bohr atom

Haendler, Blanca L.

Journal:

Journal of Chemical Education

Année:

1982

Langue:

english

Fichier:

PDF, 4.81 MB

english, 1982

11

[IEEE 2009 Proceedings of ESSCIRC (ESSCIRC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of ESSCIRC - Impact of a 10nm Ultra-Thin BOX (UTBOX) and Ground Plane on FDSOI devices for 32nm node and below

Fenouillet-Beranger, C., Perreau, P., Denorme, S., Tosti, L., Andrieu, F., Weber, O., Barnola, S., Arvet, C., Campidelli, Y., Haendler, S., Beneyton, R., Perrot, C., de Buttet, C., Gros, P., Pham-Nguy

Année:

2009

Langue:

english

Fichier:

PDF, 1.45 MB

english, 2009

12

Dynamic variability in 14nm FD-SOI MOSFETs and transient simulation methodology

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Haendler, Sebastien, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Journal:

Solid-State Electronics

Année:

2015

Langue:

english

Fichier:

PDF, 841 KB

english, 2015

13

„Haben wir nicht alle einen Gott?“

Haendler, Klaus

Journal:

Evangelische Theologie

Année:

1969

Langue:

german

Fichier:

PDF, 1.71 MB

german, 1969

14

Schriftprinzip und theologischer Pluralismus

Haendler, Klaus

Journal:

Evangelische Theologie

Année:

1968

Langue:

german

Fichier:

PDF, 992 KB

german, 1968

15

[ASME ASME Turbo Expo 2009: Power for Land, Sea, and Air - Orlando, Florida, USA (June 8–12, 2009)] Volume 1: Aircraft Engine; Ceramics; Coal, Biomass and Alternative Fuels; Controls, Diagnostics and Instrumentation; Education; Electric Power; Awards and Honors - Innovative Design Features of the SGT5-8000H Turbine and Secondary Air System

Rudolph, Ronald, Sunshine, Robert, Woodhall, Michael, Haendler, Michael

Année:

2009

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2009

16

[IEEE 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - Edinburgh, United Kingdom (2020.5.4-2020.5.18)] 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - Integrated Variability Measurements of 28 nm FDSOI MOSFETs down to 4.2 K for Cryogenic CMOS Applications

Paz, Bruna Cardoso, Guevel, Loick Le, Casse, Mikael, Billiot, Gerard, Pillonnet, Gael, Jansen, Aloysius, Haendler, Sebastien, Juge, Andre, Vincent, Emmanuel, Galy, Philippe, Ghibaudo, Gerard, Vinet, M

Année:

2020

Fichier:

PDF, 248 KB

2020

17

The crystal structures of AuTe2Cl and AuTe2I

H.M. Haendler, D. Mootz, A. Rabenau, G. Rosenstein

Journal:

Journal of Solid State Chemistry

Année:

1974

Langue:

english

Fichier:

PDF, 506 KB

english, 1974

18

Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs

François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra

Journal:

Solid-State Electronics

Année:

2004

Langue:

english

Fichier:

PDF, 681 KB

english, 2004

19

Impact of front oxide quality on transient effects and low-frequency noise in partially and fully depleted SOI N-MOSFETs

S. Haendler, F. Dieudonné, J. Jomaah, F. Balestra, C. Raynaud, J.L. Pelloie

Journal:

Solid-State Electronics

Année:

2002

Langue:

english

Fichier:

PDF, 682 KB

english, 2002

20

SOI Technologies Overview for Low-Power Low-Voltage Radio-Frequency Applications

O. Rozeau, J. Jomaah, S. Haendler, J. Boussey, F. Balestra

Journal:

Analog Integrated Circuits and Signal Processing

Année:

2000

Langue:

english

Fichier:

PDF, 530 KB

english, 2000

21

[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - 28nm FDSOI technology platform for high-speed low-voltage digital applications

Planes, N., Weber, O., Barral, V., Haendler, S., Noblet, D., Croain, D., Bocat, M., Sassoulas, P.-O., Federspiel, X., Cros, A., Bajolet, A., Richard, E., Dumont, B., Perreau, P., Petit, D., Golanski,

Année:

2012

Langue:

english

Fichier:

PDF, 535 KB

english, 2012

22

Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs

Ioannidis, E.G., Dimitriadis, C.A., Haendler, S., Bianchi, R.A., Jomaah, J., Ghibaudo, G.

Journal:

Solid-State Electronics

Année:

2012

Langue:

english

Fichier:

PDF, 394 KB

english, 2012

23

Characterization and modeling of low frequency noise in CMOS inverters

Ioannidis, E.G., Haendler, S., Dimitriadis, C.A., Ghibaudo, G.

Journal:

Solid-State Electronics

Année:

2013

Langue:

english

Fichier:

PDF, 539 KB

english, 2013

24

"Centrifugal" force and the Bohr model of the hydrogen atom

Haendler, Blanca L.

Journal:

Journal of Chemical Education

Année:

1981

Langue:

english

Fichier:

PDF, 1.07 MB

english, 1981

25

Evolution of low frequency noise and noise variability through CMOS bulk technology nodes from 0.5μm down to 20nm

Ioannidis, E.G., Haendler, S., Theodorou, C.G., Lasserre, S., Dimitriadis, C.A., Ghibaudo, G.

Journal:

Solid-State Electronics

Année:

2014

Langue:

english

Fichier:

PDF, 1.11 MB

english, 2014

26

Study of substrate orientations impact on Ultra Thin Buried Oxide (UTBOX) FDSOI High-K Metal gate technology performances

Ben Akkez, Imed, Fenouillet-Beranger, Claire, Cros, Antoine, Perreau, Pierre, Haendler, Sébatien, Weber, Olivier, Andrieu, François, Pellissier-Tanon, D., Abbate, F., Richard, C., Beneyton, R., Gourau

Journal:

Solid-State Electronics

Année:

2013

Langue:

english

Fichier:

PDF, 1.71 MB

english, 2013

27

Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology

Fenouillet-Beranger, C., Perreau, P., Benoist, T., Richier, C., Haendler, S., Pradelle, J., Bustos, J., Brun, P., Tosti, L., Weber, O., Andrieu, F., Orlando, B., Pellissier-Tanon, D., Abbate, F., Rich

Journal:

Solid-State Electronics

Année:

2013

Langue:

english

Fichier:

PDF, 3.02 MB

english, 2013

28

Unexpected impact of germanium content in SiGe bulk PMOSFETs

Diouf, C., Cros, A., Soussou, A., Rideau, D., Haendler, S., Rosa, J., Ghibaudo, G.

Journal:

Solid-State Electronics

Année:

2013

Langue:

english

Fichier:

PDF, 2.13 MB

english, 2013

29

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Low frequency noise variability in high-k/metal gate stack 28nm bulk and FD-SOI CMOS transistors

Ioannidis, E. G., Haendler, S., Bajolet, A., Pahron, T., Planes, N., Arnaud, F., Bianchi, R.A., Haond, M., Golanski, D., Rosa, J., Fenouillet-Beranger, C., Perreau, P., Dimitriadis, C.A., Ghibaudo, G.

Année:

2011

Langue:

english

Fichier:

PDF, 2.50 MB

english, 2011

30

Surface tension by maximum bubble pressure

Haendler, Helmut M., McGuire, Waldemar S.

Journal:

Journal of Chemical Education

Année:

1937

Langue:

english

Fichier:

PDF, 1.77 MB

english, 1937

31

[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Haendler, Sebastien, Planes, Nicolas, Arnaud, Franck, Jomaah, Jalal, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Année:

2012

Langue:

english

Fichier:

PDF, 1.95 MB

english, 2012

32

Zur Frage nach dem Petrusamt in der alten Kirche

Journal:

Studia Theologica

Année:

1976

Fichier:

PDF, 2.02 MB

1976

33

Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications

Seif, M., Pascal, F., Sagnes, B., Hoffmann, A., Haendler, S., Chevalier, P., Gloria, D.

Journal:

Microelectronics Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 1.32 MB

english, 2014

34

[IEEE 2013 International Conference on Noise and Fluctuations (ICNF) - Montpellier, France (2013.06.24-2013.06.28)] 2013 22nd International Conference on Noise and Fluctuations (ICNF) - Low frequency noise measurements of advanced BiCMOS SiGeC Heterojunction Bipolar Transistors used for mm-Wave to terahertz applications

Seif, M., Pascal, F., Sagnes, B., Hoffmann, A., Haendler, S., Chevalier, P., Gloria, D.

Année:

2013

Langue:

english

Fichier:

PDF, 665 KB

english, 2013

35

[IEEE 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG) - formerly known as the Semiconductor Conference Dresden (SCD) - Grenoble, France (2012.09.24-2012.09.26)] 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG) - Front-back gate coupling effect on 1/f noise in ultra-thin Si film FDSOI MOSFETs

Theodorou, C. G., Ioannidis, E. G., Haendler, S., Planes, N., Arnaud, F., Andrieu, F., Poiroux, T., Faynot, O., Jomaah, J., Dimitriadis, C. A., Ghibaudo, G.

Année:

2012

Langue:

english

Fichier:

PDF, 939 KB

english, 2012

36

[Ernst Schering Research Foundation Workshop] The Histone Code and Beyond Volume 57 || Histone Post-Translational Modifications Regulate Transcription and Silent Chromatin in Saccharomyces cerevisiae

Berger, S. L., Nakanishi, O., Haendler, B.

Année:

2006

Fichier:

PDF, 292 KB

2006

37

Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction

Karatsori, T.A., Theodorou, C.G., Ioannidis, E.G., Haendler, S., Josse, E., Dimitriadis, C.A., Ghibaudo, G.

Journal:

Solid-State Electronics

Année:

2015

Langue:

english

Fichier:

PDF, 627 KB

english, 2015

38

[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Full front and back gate voltage range method for the parameter extraction of advanced FDSOI CMOS devices

Karatsori, T. A., Theodorou, C. G., Ioannidis, E. G., Haendler, S., Josse, E., Dimitriadis, C. A., Ghibaudo, G.

Année:

2015

Langue:

english

Fichier:

PDF, 978 KB

english, 2015

39

Study of low frequency noise in advanced SiGe:C heterojunction bipolar transistors

M. Seif, F. Pascal, B. Sagnes, A. Hoffmann, S. Haendler, P. Chevalier, D. Gloria

Année:

2014

Langue:

english

Fichier:

PDF, 3.35 MB

english, 2014

40

A Comparison of Cylindrical and Fan-Shaped Film-Cooling Holes on a Vane Endwall at Low and High Freestream Turbulence Levels

Colban, W., Thole, K. A., Haendler, M.

Journal:

Journal of Turbomachinery

Année:

2008

Langue:

english

Fichier:

PDF, 1.55 MB

english, 2008

41

[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - Low frequency noise statistical characterization of 14nm FDSOI technology node

Ioannidis, E. G., Theodorou, C. G., Haendler, S., Joo, M.-K., Josse, E., Dimitriadis, C. A., Ghibaudo, G.

Année:

2015

Langue:

english

Fichier:

PDF, 270 KB

english, 2015

42

[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs

Karatsori, T. A., Theodorou, C. G., Haendler, S., Dimitriadis, C. A., Ghibaudo, G.

Année:

2016

Langue:

english

Fichier:

PDF, 884 KB

english, 2016

43

English Grammar and Style

Haendler, Pamela, Gilliver, Stephen

Journal:

Medical Writing

Année:

2012

Langue:

english

Fichier:

PDF, 244 KB

english, 2012

44

English Grammar and Style

Kingdom, Wendy, Reeves, Alistair, Jordan, Debbie, Haendler, Pamela, Kidd, Alistair

Journal:

Medical Writing

Année:

2013

Langue:

english

Fichier:

PDF, 302 KB

english, 2013

45

Ternary Systems with Ammonium Nitrate and Guanidine Nitrate.

Clark, P. E., Clow, A., Easterbrook, E. K., Haendler, H. M., Iddles, H. A.

Journal:

Journal of Physical Chemistry

Année:

1949

Langue:

english

Fichier:

PDF, 362 KB

english, 1949

46

Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs

Karatsori, T.A., Theodorou, C.G., Haendler, S., Dimitriadis, C.A., Ghibaudo, G.

Journal:

Solid-State Electronics

Année:

2016

Langue:

english

Fichier:

PDF, 1.42 MB

english, 2016

47

Heat Transfer and Film-Cooling Measurements on a Stator Vane With Fan-Shaped Cooling Holes

Colban, W., Gratton, A., Thole, K. A., Haendler, M.

Journal:

Journal of Turbomachinery

Année:

2006

Langue:

english

Fichier:

PDF, 1.07 MB

english, 2006

48

[ASME ASME 2005 Summer Heat Transfer Conference collocated with the ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems - San Francisco, California, USA (July 17–22, 2005)] Heat Transfer: Volume 2 - Microscale Boiling Heat Transfer Near the Meniscus

Haendler, Brenda E., Walther, David C., Liepmann, Dorian, Pisano, Albert P.

Année:

2005

Langue:

english

Fichier:

PDF, 560 KB

english, 2005

49

Testing the effect of an arbitrary subject pronoun on relative clause comprehension: a study with Hebrew-speaking children

HAENDLER, Yair, ADANI, Flavia

Journal:

Journal of Child Language

Année:

2018

Langue:

english

Fichier:

PDF, 347 KB

english, 2018

50

Expression of transcripts for cysteine-rich secretory proteins (CRISPs) in the murine lacrimal gland

Bernard Haendler, Ikuko Toda, David A. Sullivan, Wolf-Dieter Schleuning

Journal:

Journal of Cellular Physiology

Année:

1999

Langue:

english

Fichier:

PDF, 177 KB

english, 1999